Koehler EDX3500 Benchtop EDXRF Elemental Analyzer

Rp123

The K47925 EDXRF can analyze a large array of elements from 11Na to 92U in solids, liquids, alloys, powders and thin films. The Advanced model delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types. The Silicon Drift Detector provides superior data quality and the multiple automated tube filters enhance sensitivity. Also, polarized excitation is used for lower detection limits.

https://karuniainstrument.com/Jual/koehler-edx3500-…emental-analyzer/

EDX3500 Benchtop EDXRF For the determination of total sulfur in petroleum and petroleum products that are single-phase. These materials can include diesel fuel, jet fuel, kerosene, other distillate oil, naphtha, residual oil, lubricating base oil, hydraulic oil, crude oil, unleaded gasoline, gasohol, and similar petroleum products. Also, for the determination of the total lead content of a gasoline.

EDX3500 Benchtop EDXRF Features :

  • Conforms to the specifications of ASTM D4294, D5059, D6481, D7212, D7220, ISO 20847, ISO8754, IP 496, IP 336, JIS K 2541-1
  • Correlates to ASTM D2622
  • Menu Based Software for control of spectrometer functions and data analysis
  • Application templates
  • Simple Flow Bar Wizard to create new methods
  • Profile Fitting Software for qualitative and quantitative analysis
  • Matching library for augmentation of fundamental parameters
  • Automatic spectral overlap deconvolution
  • Empirical Calibration with overlap and matrix compensation

Specifications :

  • Conforms to the specifications of: 
    ASTM D4294, D5059, D6481, D7212, D7220, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1. Correlates to ASTM D2622
  • Excitation:
    • 50 kV X-Ray Tube with Pd Anode
    • 50W Maximum Power
    • 4 Standard Polarization and Secondary Targets depending on application for optimum excitation
    • Optional Fifth Target for optimal excitation of Na and Mg
  • Detection:
    • High Performance Silicon Drift Semiconductor Detector
    • Peltier Electronic Cooling
    • Optimum Balance of spectral resolution and high count rate
  • Sample Chamber:
    • Large 38cm dia. X 10cm deep sample chamber for bulk samples
    • 15-Position Automatic Sample Changer (32mm Sample Cups)
    • Analysis in Air, Helium Purge, or Vacuum Available
  • User Interface (Computer):
    • External PC Computer System including: Microsoft Windows Vista Operating System Keyboard and Mouse, Monitor, Printer
  • Environmental Conditions:
    • Ambient Temperatures 18 – 28°C (65 – 82°F)
    • Relative Humidity < 75%
    • Vibration undetectable by humans
    • Free from corrosive gas, dust, and particles

Dimensions : 

wxdxh,in.(cm): 18.2 x 19.4 x 15.0 (46.3 x 49.2x 38.2 cm)
Net Weight: 145 lbs (65.8 kg)

Electrical Requirements :

wxdxh,in.(cm): 18.2 x 19.4 x 15.0 (46.3 x 49.2x 38.2 cm)
Net Weight: 145 lbs (65.8 kg)

 

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