ACZET Stark Coating Thickness Measurement on Metals, Gold Silver Analysis in jewellery and alloys

ACZET Stark Coating Thickness Measurement on Metals, Gold & Silver Analysis in jewellery and alloys

ACZET Stark Coating Thickness Measurement on Metals, Gold & Silver Analysis in jewellery and alloys

Description

• The StarK XRF is a high‑performance, cost‑effective solution for gold and precious metals analysis in the jewelry industry, as well as coating thickness measurement on metals.

• Utilizes next‑generation technology, advanced detectors, and sophisticated software to accurately identify elemental composition in solids, liquids, and powders.

• Developed through years of product development and user feedback, offering fast, easy, and high‑performance XRF analysis that meets strict customer specifications.

• Features a smart, compact design that is convenient for various applications at an affordable price, maximizing quality control ROI.

• Non‑destructive – determines chemical composition without damaging the sample.

• Can be readily automated for use in industrial environments.

• Excels in quick and precise materials analysis, user‑friendly handling, and is especially ideal for analyzing precious metals and gold alloys.

• Delivers the best performance, wide analysis range, and best repeatability in the industry.

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Key Features

• Powerful analysis with smart design

• Easy and simple user interface

• Compact, convenient, powerful performance

• Measuring direction: Bottom to top

• Fixed sample positioning stage for reliable measurements

• Multiple detector options for accurate elemental analysis

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Specifications

• Measuring Direction: Bottom to top

• Applied Application: Coating thickness measurement on metals; gold & silver analysis in jewellery and alloys

• X‑ray Tube: Mini‑focus, high performance, W‑target, spot size 0.2 mm – 0.8 mm

• High Voltage: 50 kV (1.2 mA) with software‑controlled optimization

• Detector Options:

  • High‑resolution gas‑filled proportional counter

  • Silicon pin detector

  • Silicon drift detector

• Measurement Time: 60 sec to 180 sec

• Collimator: 0.3 mm Ø or 0.5 mm Ø

• Multi‑Collimator: 0.3 mm Ø or 0.5 mm Ø; optional four‑position collimator changer

• Sample Stage: Fixed sample positioning

• Power Supply: 230 VAC, 50/60 Hz, 120 W / 100 W

• Inside Chamber Dimensions (W × D × H): 330 × 200 × 170 mm

• External Dimensions (L × W × H): 500 × 652 × 500 mm

• Weight: Approximately 32 kg

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Applications

• Coating thickness measurement on metals

• Gold and silver analysis in jewellery and alloys

• Precious metals and gold alloy verification

• Material composition analysis for solids, liquids, and powders

• Quality control in jewelry manufacturing and metal refining